Nir BenDavid
4Patents
2h-index
22Co-inventors
37Inventor score
Filing activity: Jan 21, 2020 → Feb 27, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11761969B2 | System and method for analyzing a sample with a dynamic recipe based on iterative experimentation and feedback | Physics | 3 | Active |
| US11353799B1 | System and method for error reduction for metrology measurements | Electricity | 3 | Active |
| US11592755B2 | Enhancing performance of overlay metrology | Electricity | 1 | Active |
| US12001148B2 | Enhancing performance of overlay metrology | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.