Norimasa Nishimura
4Patents
4h-index
11Co-inventors
40Inventor score
Filing activity: Nov 19, 1998 → Jun 8, 2000
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6465781B1 | Method and apparatus for inspecting or measuring a sample based on charged-particle beam imaging, and a charged-particle beam apparatus | Electricity | 43 | Expired |
| US6303932A | Method and its apparatus for detecting a secondary electron beam image and a method and its apparatus for processing by using focused charged particle beam | Electricity | 42 | Expired |
| US6476387B1 | Method and apparatus for observing or processing and analyzing using a charged beam | Electricity | 18 | Expired |
| US6507029B1 | Sample processing apparatus and method for removing charge on sample through light irradiation | Electricity | 7 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.