Ofer Kadar
2Patents
2h-index
10Co-inventors
41Inventor score
Filing activity: Sep 8, 2003 → Jan 15, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7339661B2 | Dark field inspection system | Electricity | 16 | Expired |
| US9523714B2 | Electrical inspection of electronic devices using electron-beam induced plasma probes | Electricity | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.