Ofer Yuli
4Patents
1h-index
9Co-inventors
30Inventor score
Filing activity: May 23, 2019 → Dec 2, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11139142B2 | High-resolution three-dimensional profiling of features in advanced semiconductor devices in a non-destructive manner using electron beam scanning electron microscopy | Electricity | 1 | Active |
| US10943763B1 | Use of electron beam scanning electron microscopy for characterization of a sidewall occluded from line-of-sight of the electron beam | Electricity | 0 | Active |
| US10886092B2 | Charged particle beam source and a method for assembling a charged particle beam source | Electricity | 0 | Active |
| US11189451B2 | Charged particle beam source and a method for assembling a charged particle beam source | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.