Inventor · Haniel, IL

Ofir Greenberg

3Patents
1h-index
8Co-inventors
33Inventor score

Filing activity: Mar 16, 2015 → Mar 3, 2020

Most-cited inventions

PatentTitleAreaCited byStatus
US9490101B2 System and method for scanning an object Electricity 1 Active
US9673022B2 Review of suspected defects using one or more reference dies Electricity 1 Active
US11301987B2 Determining locations of suspected defects Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.