Ophir Gvirtzer
4Patents
2h-index
11Co-inventors
41Inventor score
Filing activity: Feb 1, 2007 → Jan 16, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8238647B2 | Method and system for defect detection | Physics | 13 | Active |
| US8160350B2 | Method and system for evaluating a variation in a parameter of a pattern | Physics | 2 | Active |
| US10661438B2 | Robot apparatus, methods and computer products | Emerging Cross-Sectional Technologies | 0 | Active |
| US7970201B2 | Method and system for defect detection | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.