Inventor · Taipei, TW

Pao-Ling Kuo

4Patents
3h-index
4Co-inventors
39Inventor score

Filing activity: Jul 22, 1993 → Sep 20, 2001

Most-cited inventions

PatentTitleAreaCited byStatus
US5454871A SOG coated apparatus to solve SOG non-uniformity in the VLSI process Electricity 61 Expired
US6303509A Method to calibrate the wafer transfer for oxide etcher (with clamp) Electricity 35 Expired
US5371046A Method to solve sog non-uniformity in the VLSI process Electricity 10 Expired
US6531326B2 Method to calibrate the wafer transfer for oxide etcher (with clamp) Electricity 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.