Parul Dhagat
2Patents
0h-index
7Co-inventors
21Inventor score
Filing activity: Jan 11, 2016 → Jun 7, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US10146036B2 | Semiconductor wafer inspection using care area group-specific threshold settings for detecting defects | Physics | 0 | Active |
| US9741581B2 | Using tensile mask to minimize buckling in substrate | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.