Patrick M. Shepherd
14Patents
8h-index
16Co-inventors
69Inventor score
Filing activity: Dec 1, 1993 → Nov 29, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5682472A | Method and system for testing memory programming devices | Physics | 49 | Expired |
| US8506335B2 | Apparatus for testing electronic devices | Physics | 29 | Active |
| US5429510A | High-density interconnect technique | Electricity | 24 | Expired |
| US8628336B2 | Apparatus for testing electronic devices | Physics | 23 | Active |
| US9316683B2 | Apparatus for testing electronic devices | Physics | 17 | Active |
| US8118618B2 | Apparatus for testing electronic devices | Physics | 11 | Active |
| US8388357B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US11255903B2 | Apparatus for testing electronic devices | Physics | 10 | Active |
| US9151797B2 | Apparatus for testing electronic devices | Physics | 1 | Active |
| US8747123B2 | Apparatus for testing electronic devices | Physics | 1 | Active |
| US12163999B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US10094872B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US11860221B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
| US10852347B2 | Apparatus for testing electronic devices | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.