Paul DERWIN
2Patents
1h-index
11Co-inventors
34Inventor score
Filing activity: Feb 22, 2017 → Mar 5, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11022896B2 | Mark position determination method | Physics | 1 | Active |
| US11662666B2 | Sub-field control of a lithographic process and associated apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.