Paul ISBESTER
2Patents
0h-index
7Co-inventors
24Inventor score
Filing activity: Jun 22, 2016 → Jun 27, 2019
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11300948B2 | Process control of semiconductor fabrication based on spectra quality metrics | Emerging Cross-Sectional Technologies | 0 | Active |
| US10534275B2 | Method for use in process control of manufacture of patterned sample | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.