Peter Groot
4Patents
4h-index
4Co-inventors
39Inventor score
Filing activity: Jul 9, 1999 → Mar 19, 2008
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6359692B1 | Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry | Physics | 205 | Expired |
| US6597460B2 | Height scanning interferometer for determining the absolute position and surface profile of an object with respect to a datum | Physics | 50 | Expired |
| US6775006B2 | Height scanning interferometry method and apparatus including phase gap analysis | Physics | 37 | Expired |
| US7639367B2 | Interferometer system for monitoring an object | Physics | 6 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.