Raanan Adin
3Patents
1h-index
7Co-inventors
30Inventor score
Filing activity: Dec 27, 2002 → Oct 15, 2006
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6810297B2 | System and methods for imaging employing a levitating conveyor | Electricity | 18 | Expired |
| US7795887B2 | Photoconductive based electrical testing of transistor arrays | Physics | 1 | Active |
| US7636466B2 | System and method for inspecting workpieces having microscopic features | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.