Ralph Johnson
9Patents
5h-index
51Co-inventors
66Inventor score
Filing activity: Jul 19, 1993 → Jan 5, 2017
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5502306A | Electron beam inspection system and method | Electricity | 259 | Expired |
| US5355212A | Process for inspecting patterned wafers | Physics | 114 | Expired |
| US5604585A | Particle detection system employing a subsystem for collecting scattered light from the particles | Physics | 62 | Expired |
| US6686995B2 | Two-dimensional UV compatible programmable spatial filter | Physics | 14 | Expired |
| US6775051B2 | Systems and methods for scanning a beam of light across a specimen | Physics | 12 | Expired |
| US9395340B2 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Physics | 4 | Active |
| US9546962B2 | Multi-spot scanning collection optics | Physics | 2 | Active |
| US9970883B2 | Multi-spot scanning collection optics | Physics | 1 | Active |
| US10060884B2 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.