Inventor · Aalen, DE

Ralph Klaesges

3Patents
1h-index
10Co-inventors
37Inventor score

Filing activity: Sep 8, 2004 → Jun 21, 2011

Most-cited inventions

PatentTitleAreaCited byStatus
US7019824B2 Moire method and measuring system for measuring the distortion of an optical imaging system Physics 4 Expired
US9034539B2 Controllable transmission and phase compensation of transparent material Chemistry; Metallurgy 1 Active
US8735030B2 Method and apparatus for modifying a substrate surface of a photolithographic mask Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.