Ran BADANES
3Patents
1h-index
9Co-inventors
30Inventor score
Filing activity: Jan 2, 2020 → Apr 4, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11449711B2 | Machine learning-based defect detection of a specimen | Physics | 1 | Active |
| US12423800B2 | Machine learning based defect examination for semiconductor specimens | Physics | 0 | Active |
| US12400319B2 | Defect examination on a semiconductor specimen | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.