Ran Goldman
4Patents
2h-index
13Co-inventors
34Inventor score
Filing activity: Jul 13, 2015 → Mar 12, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9530199B1 | Technique for measuring overlay between layers of a multilayer structure | Physics | 8 | Active |
| US9916652B2 | Technique for measuring overlay between layers of a multilayer structure | Physics | 2 | Active |
| US10354376B2 | Technique for measuring overlay between layers of a multilayer structure | Physics | 0 | Active |
| US9824852B2 | CD-SEM technique for wafers fabrication control | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.