Robert Haynes
13Patents
5h-index
19Co-inventors
63Inventor score
Filing activity: Mar 27, 1992 → May 2, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8513619B1 | Non-planar extractor structure for electron source | Electricity | 12 | Active |
| US5549269A | Gas spring assembly | Mechanical Engineering; Lighting; Heating | 11 | Expired |
| US8455838B2 | Multiple-column electron beam apparatus and methods | Electricity | 10 | Active |
| US5348266A | Reduced horizontal stiffness vibration isolation system | Mechanical Engineering; Lighting; Heating | 8 | Expired |
| US8421030B2 | Charged-particle energy analyzer | Electricity | 5 | Active |
| US9591770B2 | Multi-layer ceramic vacuum to atmosphere electric feed through | Emerging Cross-Sectional Technologies | 4 | Active |
| US8618513B2 | Apparatus and methods for forming an electrical conduction path through an insulating layer | Electricity | 4 | Active |
| US8633457B2 | Background reduction system including louver | Electricity | 3 | Active |
| US9513230B2 | Apparatus and method for optical inspection, magnetic field and height mapping | Electricity | 2 | Active |
| US10354832B2 | Multi-column scanning electron microscopy system | Electricity | 1 | Active |
| US10438769B1 | Array-based characterization tool | Electricity | 1 | Active |
| US10777377B2 | Multi-column spacing for photomask and reticle inspection and wafer print check verification | Electricity | 0 | Active |
| US10840056B2 | Multi-column scanning electron microscopy system | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.