Robert M. Glidden
4Patents
3h-index
5Co-inventors
39Inventor score
Filing activity: Dec 15, 2004 → May 14, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7312622B2 | Wafer level testing for RFID tags | Physics | 27 | Expired |
| US7307528B2 | RFID tag design with circuitry for wafer level testing | Physics | 26 | Expired |
| US7380190B2 | RFID tag with bist circuits | Physics | 22 | Expired |
| US9165232B2 | Radio-frequency identification (RFID) tag-to-tag autoconnect discovery, and related methods, circuits, and systems | Electricity | 1 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.