Robert Wadsworth
3Patents
2h-index
3Co-inventors
37Inventor score
Filing activity: Jul 30, 1999 → Mar 3, 2011
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6477673B1 | Structure and method with which to generate data background patterns for testing random-access-memories | Physics | 4 | Expired |
| US7978095B2 | Test mode circuitry for a programmable tamper detection circuit | Physics | 2 | Active |
| US8827165B2 | Test mode circuitry for a programmable tamper detection circuit | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.