Ron Katzir
7Patents
2h-index
17Co-inventors
40Inventor score
Filing activity: Jun 1, 2015 → Nov 8, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9851714B2 | Method of inspecting a specimen and system thereof | Emerging Cross-Sectional Technologies | 3 | Active |
| US10545490B2 | Method of inspecting a specimen and system thereof | Emerging Cross-Sectional Technologies | 2 | Active |
| US11882262B2 | System and method for stereoscopic image analysis | Electricity | 0 | Active |
| US10120973B2 | Method of performing metrology operations and system thereof | Physics | 0 | Active |
| US10571406B2 | Method of performing metrology operations and system thereof | Physics | 0 | Active |
| US10504693B2 | Evaluating an object | Electricity | 0 | Active |
| US10296702B2 | Method of performing metrology operations and system thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.