Sadao Terakado
6Patents
5h-index
15Co-inventors
52Inventor score
Filing activity: Aug 27, 1992 → May 10, 1999
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5594245A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 47 | Expired |
| US6114695A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 35 | Expired |
| US5866904A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 24 | Expired |
| US5969357A | Scanning electron microscope and method for dimension measuring by using the same | Electricity | 23 | Expired |
| USD381031S | Electron microscope | General | 16 | Expired |
| US5350918A | Transmission electron microscope | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.