Satoshi Imi
4Patents
2h-index
4Co-inventors
37Inventor score
Filing activity: Mar 29, 2000 → Jan 19, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6888958B1 | Method and apparatus for inspecting patterns | Physics | 8 | Expired |
| US8131060B2 | Process control method, data registration program, and method for manufacturing electronic device | Emerging Cross-Sectional Technologies | 2 | Active |
| US8300923B2 | Process control method, data registration program, and method for manufacturing electronic device | Emerging Cross-Sectional Technologies | 1 | Active |
| US7477773B2 | Method for inspecting a pattern and method for manufacturing a semiconductor chip having a circuit pattern | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.