Satya Kurada
4Patents
2h-index
14Co-inventors
37Inventor score
Filing activity: Apr 11, 2014 → Jul 26, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9310320B2 | Based sampling and binning for yield critical defects | Physics | 5 | Active |
| US9766187B2 | Repeater detection | Physics | 2 | Active |
| US9563943B2 | Based sampling and binning for yield critical defects | Physics | 1 | Active |
| US10620134B2 | Creating defect samples for array regions | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.