Scott Jansen
10Patents
4h-index
18Co-inventors
57Inventor score
Filing activity: Jan 30, 1984 → Dec 9, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7679083B2 | Semiconductor integrated test structures for electron beam inspection of semiconductor wafers | Electricity | 97 | Active |
| US4818056A | Optical connector with direct mounted photo diode | Physics | 17 | Expired |
| US4563564A | Film resistors | Emerging Cross-Sectional Technologies | 8 | Expired |
| US8278940B2 | Signal acquisition system having a compensation digital filter | Physics | 7 | Active |
| US8361879B2 | Stress-inducing structures, methods, and materials | Electricity | 4 | Active |
| US8723530B2 | Signal acquisition system having reduced probe loading of a device under test | Physics | 4 | Active |
| US8436624B2 | Signal acquisition system having reduced probe loading of a device under test | Physics | 3 | Active |
| US8564308B2 | Signal acquisition system having reduced probe loading of a device under test | Physics | 2 | Active |
| US8907444B2 | Stress-inducing structures, methods, and materials | Electricity | 1 | Active |
| US9373717B2 | Stress-inducing structures, methods, and materials | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.