Scott Zheng
2Patents
2h-index
3Co-inventors
27Inventor score
Filing activity: Jun 4, 1996 → Jan 16, 1997
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5966024A | Sensitive method of evaluating process induced damage in MOSFETs using a differential amplifier operational principle | Electricity | 10 | Expired |
| US6005409A | Detection of process-induced damage on transistors in real time | Electricity | 5 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.