Seth Craighead
5Patents
1h-index
5Co-inventors
44Inventor score
Filing activity: Jun 29, 2001 → Aug 15, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6754868B2 | Semiconductor test system having double data rate pin scrambling | Physics | 14 | Expired |
| US11619667B2 | Enhanced loopback diagnostic systems and methods | Physics | 1 | Active |
| US12203978B2 | Flexible sideband support systems and methods | Physics | 0 | Active |
| US11714132B2 | Test equipment diagnostics systems and methods | Physics | 0 | Active |
| US11733290B2 | Flexible sideband support systems and methods | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.