Patent · US Active

Enhanced loopback diagnostic systems and methods

US11619667B2 · kind B2 · utility

1Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 8, 2021
Grant dateApr 4, 2023
Priority date
Expiry dateJun 9, 2041

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3171
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Presented embodiments facilitate efficient and effective flexible implementation of different types of testing procedures in a test system. In one embodiment, a tester system diagnostic method includes forwarding test signals to a loopback component; receiving the test signals from the loopback component; and analyzing the test signals to diagnose whether or not the test system is experiencing problems associated with electrostatic discharges, including analysis of eye scan configuration data corresponding to characteristics of the test signals. In one exemplary implementation, analyzing the eye scan configuration data, including analyzing symmetry of a graphical representation (e.g., eye pattern, eye diagram, etc.) of the eye scan configuration data with respect to a horizontal graphical representation axis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.