Inventor · Hitachinaka, JP

Shahedul Hoque

20Patents

3h-index

32Co-inventors

59Inventor score

Filing activity: Jan 25, 2012 → Oct 10, 2022

Most-cited inventions

Patent	Title	Area	Cited by	Status
US9697987B2	Charged particle beam device	Electricity	6	Active
US10872745B2	Charged-particle beam system	Electricity	4	Active
US11139144B2	Charged particle beam apparatus	Electricity	3	Active
US8618499B1	Electron beam irradiation apparatus	Electricity	3	Active
US10720306B2	Charged particle beam device	Electricity	3	Active
US9053905B2	Electron beam irradiation apparatus	Electricity	3	Active
US10249474B2	Charged particle beam device	Electricity	3	Active
US10593512B2	Light guide, detector having light guide, and charged particle beam device	Electricity	1	Active
US11515120B2	Charged particle beam apparatus	Electricity	1	Active
US11749497B2	Charged particle beam apparatus	Electricity	1	Active
US11694873B2	Charged particle beam apparatus	Electricity	1	Active
US10984981B2	Charged particle beam device having inspection scan direction based on scan with smaller dose	Electricity	0	Active
US10546715B2	Charged particle beam device	Electricity	0	Active
US10984979B2	Charged particle detector and charged particle beam apparatus	Electricity	0	Active
US11239052B2	Charged particle beam device	Electricity	0	Active
US10679821B1	Light guide, detector having light guide, and charged particle beam device	Electricity	0	Active
US11798780B2	Charged particle beam device	Electricity	0	Active
US10755890B2	Charged particle beam apparatus	Electricity	0	Active
US12142455B2	Charged particle beam apparatus with multiple detectors and methods for imaging	Electricity	0	Active
US10297419B2	Scanning electron microscope with charge density control	Electricity	0	Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.