Simon Diemer
6Patents
2h-index
7Co-inventors
40Inventor score
Filing activity: Sep 29, 2011 → Feb 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8487252B2 | Particle beam microscope and method for operating the particle beam microscope | Electricity | 5 | Active |
| US9437394B1 | Method of operating a charged particle microscope and charged particle microscope operating according to such method | Electricity | 2 | Active |
| US11328896B2 | Device and method for tracking microscopic samples | Electricity | 0 | Active |
| US9916964B1 | Method of operating a charged particle microscope and charged particle microscope operating according to such method | Electricity | 0 | Active |
| US9455115B2 | Method of adjusting a stigmator in a particle beam apparatus and a Particle beam system | Electricity | 0 | Active |
| US11915907B2 | Method for operating a particle beam microscope | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.