Inventor · Frankfurt, DE

Simon Mieth

2Patents
0h-index
4Co-inventors
27Inventor score

Filing activity: Jul 22, 2019 → May 23, 2024

Most-cited inventions

PatentTitleAreaCited byStatus
US10571249B1 Optical measuring device and method Physics 0 Active
US12264914B2 Device and method for measuring wafers Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.