Sriram Anandakumar
3Patents
2h-index
4Co-inventors
33Inventor score
Filing activity: Jul 5, 2007 → Sep 30, 2014
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7797594B1 | Built-in self-test of 3-dimensional semiconductor memory arrays | Physics | 5 | Active |
| US8726114B1 | Testing of SRAMS | Physics | 3 | Active |
| US10073139B2 | Cycle deterministic functional testing of a chip with asynchronous clock domains | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.