Stavros Nicolopoulos
4Patents
2h-index
12Co-inventors
41Inventor score
Filing activity: Nov 6, 2009 → Dec 18, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8253099B2 | Methods and devices for high throughput crystal structure analysis by electron diffraction | Electricity | 14 | Active |
| US9274070B2 | System and process for measuring strain in materials at high spatial resolution | Electricity | 2 | Active |
| US9406496B2 | Method and system for improving characteristic peak signals in analytical electron microscopy | Electricity | 1 | Active |
| US12099022B2 | Devices and methods for high angle liquid electron tomography | Electricity | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.