Sterling Watson
14Patents
7h-index
23Co-inventors
66Inventor score
Filing activity: Sep 19, 1997 → Nov 16, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6076465A | System and method for determining reticle defect printability | Physics | 76 | Expired |
| US7271891B1 | Apparatus and methods for providing selective defect sensitivity | Electricity | 30 | Expired |
| US7440093B1 | Apparatus and methods for providing selective defect sensitivity | Electricity | 27 | Active |
| US7297453B2 | Systems and methods for mitigating variances on a patterned wafer using a prediction model | Emerging Cross-Sectional Technologies | 14 | Expired |
| US7303842B2 | Systems and methods for modifying a reticle's optical properties | Emerging Cross-Sectional Technologies | 14 | Expired |
| US9002497B2 | Methods and systems for inspection of wafers and reticles using designer intent data | Physics | 8 | Active |
| US6381358B1 | System and method for determining reticle defect printability | Physics | 7 | Expired |
| US7300729B2 | Method for monitoring a reticle | Emerging Cross-Sectional Technologies | 4 | Expired |
| US6731787B1 | System and method for determining reticle defect printability | Physics | 3 | Expired |
| US7300725B2 | Method for determining and correcting reticle variations | Emerging Cross-Sectional Technologies | 3 | Expired |
| US11557031B2 | Integrated multi-tool reticle inspection | Physics | 0 | Active |
| US10713771B2 | Methods and systems for inspection of wafers and reticles using designer intent data | Physics | 0 | Active |
| US11002597B2 | Solar spectrum sensor for determining value of solar spectrum based on determined average photon energy | Emerging Cross-Sectional Technologies | 0 | Active |
| US11348222B2 | Methods and systems for inspection of wafers and reticles using designer intent data | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.