Steve Short
2Patents
2h-index
13Co-inventors
34Inventor score
Filing activity: Feb 6, 2013 → Nov 2, 2015
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9176069B2 | System and method for apodization in a semiconductor device inspection system | Physics | 4 | Active |
| US9645093B2 | System and method for apodization in a semiconductor device inspection system | Physics | 2 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.