Sungyoon Ryu
6Patents
0h-index
32Co-inventors
41Inventor score
Filing activity: Oct 14, 2009 → Aug 1, 2022
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US11428645B2 | Wafer inspection device and method of manufacturing semiconductor device by using the wafer inspection device | Physics | 0 | Active |
| US11921270B2 | Inspection system including reference specimen and method of forming semiconductor device | Physics | 0 | Active |
| US12385946B2 | Method of inspecting tip of atomic force microscope and method of manufacturing semiconductor device | Electricity | 0 | Active |
| US11988495B2 | Through-focus image-based metrology device, operation method thereof, and computing device for executing the operation | Physics | 0 | Active |
| US8237925B2 | Prism for inducing Brewster's angle transmission and fluorescence detection apparatus for improving signal-to noise ratio using thereof | Physics | 0 | Active |
| US12092656B2 | Test apparatus and test method thereof | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.