Tatsuhiro Watanabe
4Patents
1h-index
5Co-inventors
41Inventor score
Filing activity: Nov 4, 1992 → Dec 20, 2018
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7200059B2 | Semiconductor memory and burn-in test method of semiconductor memory | Physics | 10 | Expired |
| US10861660B2 | Safety switch | Electricity | 1 | Active |
| US11087933B2 | Safety switch | Electricity | 0 | Active |
| US5258639A | Semiconductor memory device having multilayer wiring structure | Electricity | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.