Inventor · Tokyo, JP

Tatsuro Otaki

20Patents
9h-index
12Co-inventors
72Inventor score

Filing activity: Jan 7, 1994 → Sep 10, 2013

Most-cited inventions

PatentTitleAreaCited byStatus
US6160662A Inverted microscope having a variable stage position Physics 29 Expired
US5572359A Differential interference microscope apparatus and an observing method using the same apparatus Physics 22 Expired
US5657166A Condenser lens system for use in a microscope Physics 17 Expired
US6091911A Microscope photographing unit with brightness control for observation optical system Physics 17 Expired
US5764408A Lens-barrel optical system and microscope apparatus Physics 13 Expired
US6317261A Phase contrast observation device Physics 11 Expired
US5808790A Integrated microscope providing near-field and light microscopy Performing Operations; Transporting 11 Expired
US6657787B1 Contrast improvement optical apparatus and method Physics 10 Expired
US5880455A Focal position detection apparatus having a light reflecting member with plural reflecting films Physics 9 Expired
US6128128A Microscope system Physics 8 Expired
US6178294A Photographing unit for a microscope Physics 7 Expired
US5699197A Microscope with a condenser lens system having a tapered portion Physics 6 Expired
US5847866A Lens-barrel optical system and microscope apparatus Physics 5 Expired
US5802406A Focusing glass and photographic system Physics 3 Expired
US5687416A Photographic apparatus with selectable photometric optical systems Physics 2 Expired
US8558996B2 Wavefront aberration measuring apparatus Emerging Cross-Sectional Technologies 2 Active
US7092151B2 Microscope having a pipette device Physics 1 Expired
US8687179B2 Wavefront aberration measuring apparatus Emerging Cross-Sectional Technologies 0 Active
US5717520A Intermediate lens barrel for microscope Physics 0 Expired
US6549334B1 Transmission illumination type differential interference microscope Physics 0 Expired

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.