Patent · US Expired

Integrated microscope providing near-field and light microscopy

US5808790A · kind A · utility

11Cited by
5References
17Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 10, 1997
Grant dateSep 15, 1998
Priority date
Expiry dateJan 10, 2017

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB82Y35/00
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Apparatus are disclosed that perform, on demand, both near-field microscopy (NFM) and light-microscopy (e.g., bright-field microscopy or phase-contrast microscopy) of a specimen. The apparatus comprises an NFM microscope including an NFM probe, a first condenser lens system that converges a center portion of an illumination-light flux at a first terminus of the NFM probe, and a second condenser lens system that converges an annular portion of the illumination-light flux at a specimen to illuminate the specimen by Kohler illumination. Evanescent light from a distal terminus of the NFM probe passes to a locus on the specimen. Downstream optics capture light transmitted and/or scattered from the specimen from the NFM probe and from the Kohler illumination to produce both a light-microscope image of the specimen and an NFM image of the specimen.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.