Thomas Herrmann
14Patents
9h-index
23Co-inventors
72Inventor score
Filing activity: Sep 10, 1992 → Nov 18, 2016
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5500075A | Leg elastic applicator which maintains the spacing between the elastics substantially constant | Emerging Cross-Sectional Technologies | 121 | Expired |
| US5531850A | Apparatus and method for applying transverse tensioned elastic | Emerging Cross-Sectional Technologies | 99 | Expired |
| US5660664A | Method of applying leg elastic | Emerging Cross-Sectional Technologies | 69 | Expired |
| US5429694A | Apparatus and method for applying tensioned elastic to material | Emerging Cross-Sectional Technologies | 65 | Expired |
| US5383988A | Modular apparatus for fabricating an absorbent article | Emerging Cross-Sectional Technologies | 50 | Expired |
| US5492591A | Modular apparatus for fabricating an absorbent article | Emerging Cross-Sectional Technologies | 33 | Expired |
| US5626711A | Apparatus for producing elasticized undergarment products | Emerging Cross-Sectional Technologies | 32 | Expired |
| US5788805A | Apparatus for producing elasticized products | Emerging Cross-Sectional Technologies | 31 | Expired |
| US7653845B2 | Test algorithm selection in memory built-in self test controller | Physics | 10 | Active |
| US7352505B2 | Device and method for converting an optical frequency | Physics | 2 | Expired |
| US8595227B2 | Semantic activity awareness | Physics | 2 | Active |
| US10095826B2 | Feed-forward for silicon inspections (DFM2CFM : design to silicon) and feed-back for weakpoint predictor decks (CFM2DFM : silicon to design) guided by marker classification, sampling, and higher dimensional analysis | Electricity | 0 | Active |
| US9898572B2 | Metal line layout based on line shifting | Physics | 0 | Active |
| US10191112B2 | Early development of a database of fail signatures for systematic defects in integrated circuit (IC) chips | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.