Thomas M. Storey
4Patents
3h-index
7Co-inventors
43Inventor score
Filing activity: Feb 21, 1989 → Apr 18, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US5517515A | Multichip module with integrated test circuitry disposed within interposer substrate | Physics | 101 | Expired |
| US4852061A | High density, high performance register file having improved clocking means | Physics | 14 | Expired |
| US6697978B1 | Method for testing of known good die | Physics | 11 | Expired |
| US6883113B2 | System and method for temporally isolating environmentally sensitive integrated circuit faults | Physics | 0 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.