Ting Yu
20Patents
4h-index
25Co-inventors
59Inventor score
Filing activity: Apr 8, 2008 → Jun 22, 2021
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US9070057B2 | Method and system for identification of assets | Performing Operations; Transporting | 8 | Active |
| US8320617B2 | System, method and program product for camera-based discovery of social networks | Physics | 8 | Active |
| US10271017B2 | System and method for generating an activity summary of a person | Electricity | 7 | Active |
| US9785744B2 | System and method for protocol adherence | Physics | 7 | Active |
| US8355576B2 | Method and system for crowd segmentation | Physics | 4 | Active |
| US8842881B2 | Real-time video tracking system | Physics | 2 | Active |
| US9626581B2 | Real-time video tracking system | Physics | 2 | Active |
| US9854994B2 | Method and system for wireless respiration rate monitoring using space and frequency diversities | Human Necessities | 2 | Active |
| US9384448B2 | Action-based models to identify learned tasks | Physics | 2 | Active |
| US10361000B2 | System and method for protocol adherence | Physics | 1 | Active |
| US10682090B2 | Sensing device for controlling the delivery of care to immobile patients | Physics | 1 | Active |
| US9305357B2 | Automatic surveillance video matting using a shape prior | Physics | 1 | Active |
| US9934358B2 | System and method for protocol adherence | Physics | 0 | Active |
| US10147021B2 | Automatic surveillance video matting using a shape prior | Physics | 0 | Active |
| US12013431B2 | Method and testing apparatus related to wafer testing | Physics | 0 | Active |
| US10679754B2 | Systems and methods to improve lung function protocols | Physics | 0 | Active |
| US9798923B2 | System and method for tracking and recognizing people | Physics | 0 | Active |
| US10061897B2 | Systems and methods to improve lung function protocols | Physics | 0 | Active |
| US8154600B2 | Method and system for distributed multiple target tracking | Physics | 0 | Active |
| US11574696B2 | Semiconductor test system and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.