Vikram Shenoy
3Patents
3h-index
8Co-inventors
36Inventor score
Filing activity: Dec 28, 1999 → Aug 13, 2002
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6501692B1 | Circuit and method for stress testing a static random access memory (SRAM) device | Physics | 19 | Expired |
| US6363074B1 | Method and apparatus for provisioning inter-machine trunks | Electricity | 6 | Expired |
| US7032083B1 | Glitch-free memory address decoding circuits and methods and memory subsystems using the same | Physics | 4 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.