Inventor · Sunnyvale, CA, US

Wayne Chen

19Patents
8h-index
21Co-inventors
68Inventor score

Filing activity: Oct 6, 1999 → Jul 24, 2015

Most-cited inventions

PatentTitleAreaCited byStatus
US6183292A Shielded modular jack Electricity 67 Expired
US7504983B2 Motorcycle communication system with radar detector, and mounting assemblies therefor Emerging Cross-Sectional Technologies 29 Active
US7714996B2 Automatic inspection system for flat panel substrate Physics 24 Active
US8366064B2 Universal mounting apparatus Emerging Cross-Sectional Technologies 24 Active
US8566206B2 Pension fund systems Physics 24 Active
US8533087B2 Pension fund systems Physics 21 Active
US6590645B1 System and methods for classifying anomalies of sample surfaces Electricity 12 Expired
US8608120B2 Universal mounting apparatus Emerging Cross-Sectional Technologies 9 Active
US7038772B2 System and methods for classifying anomalies of sample surfaces Electricity 7 Expired
US7016031B2 System and methods for classifying anomalies of sample surfaces Electricity 5 Expired
US8556143B2 Mounting apparatus Performing Operations; Transporting 5 Active
USH200H High temperature structural insulating material General 4 Active
US7830298B2 Motorcycle communication system with radar detector, and mounting assemblies therefor Emerging Cross-Sectional Technologies 3 Active
US8646714B2 Paper shredder cutting blade set Emerging Cross-Sectional Technologies 3 Active
US10145898B2 Battery signature identification system Emerging Cross-Sectional Technologies 2 Active
US7315365B2 System and methods for classifying anomalies of sample surfaces Electricity 2 Expired
US7564544B2 Method and system for inspecting surfaces with improved light efficiency Physics 1 Active
US7986259B2 Motorcycle radar detection system Physics 0 Active
US8098184B2 Motorcycle communication system with radar detector, and mounting assemblies therefor Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.