Patent · US Active

Method for defect indication detection

US10203290B2 · kind B2 · utility

4Cited by

2References

12Claims

0Family size

Assignee

General Electric Company · US

Inventors

Andrew Frank Ferro · West Chester, US
Xingwei Yang · Schenectady, US
Paulo Ricardo Mendonca · Clifton Park, US
Christopher Allen Nafis · Rexford, US
Patrick Joseph Howard · Cincinnati, US

Key dates

Filing date	Dec 1, 2014
Grant date	Feb 12, 2019
Priority date	—
Expiry date	Sep 18, 2035

Classification

Technology area (CPC G)Physics
CPC primaryG06T2207/30108
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods, apparatus and computer-readable media for detecting potential defects in a part are disclosed. A potential defect may be automatically detected in a part, and may be reported to an operator in various ways so that the operator may review the defect and take appropriate action.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.