Yaron Zimmerman
4Patents
2h-index
11Co-inventors
41Inventor score
Filing activity: Apr 20, 2004 → Apr 16, 2020
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7724375B1 | Method and apparatus for increasing metrology or inspection tool throughput | Physics | 7 | Active |
| US7668105B1 | System for testing and/or evaluating the performance of a network switching apparatus | Electricity | 5 | Active |
| US8054522B2 | Oscillating mirror having a plurality of eigenmodes | Physics | 0 | Active |
| US12292565B2 | MEMS based light deflecting device and method | Performing Operations; Transporting | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.