Yoko Irie
2Patents
2h-index
8Co-inventors
30Inventor score
Filing activity: May 13, 1996 → Jan 23, 1998
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6072899A | Method and device of inspecting three-dimensional shape defect | Physics | 17 | Expired |
| US5930382A | Wiring pattern inspecting method and system for carrying out the same | Physics | 8 | Expired |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.