Yu YANAKA
3Patents
1h-index
6Co-inventors
30Inventor score
Filing activity: Aug 16, 2011 → Feb 4, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8547545B2 | Method and apparatus for inspecting a surface of a substrate | Physics | 20 | Active |
| US8605278B2 | Method and apparatus for inspecting patterned media disk | Physics | 0 | Active |
| US8873031B2 | Method and apparatus for inspecting surface of a disk | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.