Yusuke Miyazaki
12Patents
4h-index
18Co-inventors
53Inventor score
Filing activity: Aug 30, 1999 → Apr 24, 2012
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6376231B1 | Sample loading sheet | Emerging Cross-Sectional Technologies | 8 | Expired |
| US8723536B2 | Inspection apparatus, substrate mounting device and inspection method | Electricity | 7 | Active |
| US7723709B2 | Substrate holding apparatus, and inspection or processing apparatus | Electricity | 6 | Active |
| US7925390B2 | Mini environment apparatus, inspection apparatus, manufacturing apparatus and cleaning method of space | Emerging Cross-Sectional Technologies | 6 | Active |
| US7746461B2 | Optical defect inspection apparatus | Physics | 2 | Active |
| US8686383B2 | Object holding apparatus, and inspection apparatus | Electricity | 1 | Active |
| US7999242B2 | Substrate holding apparatus, and inspection or processing apparatus | Electricity | 0 | Active |
| US8183549B2 | Substrate holding apparatus, and inspection or processing apparatus | Electricity | 0 | Active |
| US8184283B2 | Optical defect inspection apparatus | Physics | 0 | Active |
| US6284119A | DNA base sequencer | Physics | 0 | Expired |
| US8472016B2 | Optical defect inspection apparatus | Physics | 0 | Active |
| US7894052B2 | Optical defect inspection apparatus | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.