Zhiming Jiang
4Patents
1h-index
14Co-inventors
41Inventor score
Filing activity: Jun 3, 2009 → Nov 14, 2023
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US8711349B2 | High throughput thin film characterization and defect detection | Physics | 7 | Active |
| US10088413B2 | Spectral matching based calibration | Physics | 1 | Active |
| US7903250B1 | Control by sample reflectivity | Physics | 0 | Active |
| US12429418B2 | Phase-resolved optical metrology for substrates | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.